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Image Search Results
Journal: Optics Express
Article Title: Time-resolved retardance and optic-axis angle measurement system for characterization of flexoelectro-optic liquid crystal and other birefringent devices
doi: 10.1364/oe.26.006126
Figure Lengend Snippet: Fig. 5. The chiral nematic LC device used to validate the measurement system; (a) illustration of the ULH mode, (b) illustration of the flexoelectro-optic effect, (c) polarizing optical microscope images for sample with mean optic-axis at 22.5° to the axis of one of the polarizers, under an applied 1 kHz square-wave: (i) ± 5 V, (ii) ± 10 V, (iii) ± 15 V, (iv) ± 20 V. The device consists of 3.5 wt% chiral dopant (R5011) in the nematic host E7. The thickness of the device was 4.82 µm and measurements were taken at 25°C. The discontinuities in the structure are due to the presence of spacer beads.
Article Snippet: The sample was imaged on a
Techniques: Microscopy